Published February 1999
| Version v1
Journal article
Structural phase transitions in Bi2V1-xGexO5.5-x/2 (x = 0.2, 0.4, and 0.6) single crystals: X-ray crystallographic study
- 1. Indian Inst. of Science, Bangalore (India)
Description
Single crystals of Bi2V1-xGexO5.5-x/2 (x = 0.2, 0.4, and 0.6) were grown by slow cooling of melts. Bismuth vanadate transforms from an orthorhombic to a tetragonal structure and subsequently to an orthorhombic system when the Ge4+ concentration was varied from x = 0.2 to x = 0.6. All of these compositions crystallized in polar space groups (Aba2, F4mm, and Fmm2 for x = 0.2, 0.4, and 0.6, respectively). The structures were fully determined by single crystal X-ray diffraction studies
Additional details
Publishing Information
- Journal Title
- Materials Research Bulletin
- Journal Volume
- 34
- Journal Issue
- 3
- Journal Page Range
- p. 425-432
- ISSN
- 0025-5408
- CODEN
- MRBUAC
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 30052033
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- BISMUTH OXIDES; CHEMICAL COMPOSITION; CRYSTAL STRUCTURE; CRYSTAL-PHASE TRANSFORMATIONS; GERMANIUM OXIDES; MONOCRYSTALS; VANADIUM OXIDES; X-RAY DIFFRACTION
- Descriptors DEC
- BISMUTH COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; CRYSTALS; DIFFRACTION; GERMANIUM COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PHASE TRANSFORMATIONS; SCATTERING; TRANSITION ELEMENT COMPOUNDS; VANADIUM COMPOUNDS