Published 1992
| Version v1
Journal article
Applications of x-ray fluorescence for on-line process control measurements
Description
X-ray fluorescence (XRF) has been widely accepted in industry for real-time analysis of a variety of products. In addition to good analytical performance and high reliability with low maintenance, it has the advantage that no reagents are required, and the sample is not altered; it can be returned to the process stream
Additional details
Publishing Information
- Journal Title
- Transactions of the American Nuclear Society
- Journal Volume
- 65
- Journal Issue
- 1
- Journal Page Range
- p. 19-20.
- ISSN
- 0003-018X
- CODEN
- TANSAO
Conference
- Title
- 2. topical meeting on industrial radiation and radioisotope measurement applications.
- Dates
- 8-11 Sep 1992.
- Place
- Raleigh, NC (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 24072786
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- MEASURING METHODS; MULTI-ELEMENT ANALYSIS; ON-LINE SYSTEMS; REAL TIME SYSTEMS; X-RAY FLUORESCENCE ANALYSIS; X-RAY FLUORESCENCE ANALYZERS
- Descriptors DEC
- CHEMICAL ANALYSIS; NONDESTRUCTIVE ANALYSIS; X-RAY EMISSION ANALYSIS
Optional Information
- Secondary number(s)
- CONF-920919--.