Published May 2, 2005
| Version v1
Journal article
Confinement effect of optical phonons in Si-Ge alloy nanocrystals
Creators
- 1. National Laboratory of Solid State Microstructures and Department of Physics, Nanjing University, Nanjing 210093 (China)
- 2. Department of Physics and Materials Science, City University of Hong Kong, Kowloon, Hong Kong (China)
Description
Si1-xGex nanocrystals (nc-Si1-xGex, x=(43+/-1)%) with sizes of 7∼16 nm were prepared using thermal crystallization of amorphous Si1-xGex alloy. Nanocrystal shape, composition, size, and phonon property were obtained in terms of high-resolution transmission electron microscope observations and X-ray diffraction and Raman spectral analyses. It was revealed that each optical vibration mode (Ge-Ge, Ge-Si, or Si-Si mode) is of evident phonon confinement effect. Using dispersion relationship in whole Brillouin zone, we numerically simulate the Raman spectra (peak position and linewidth) of nc-Ge and nc-Si and some evident characters in phonon confinement effect are presented for comparison with those of nc-Si1-xGex
Additional details
Identifiers
- DOI
- 10.1016/j.physleta.2005.02.051;
- PII
- S0375-9601(05)00252-5;
Publishing Information
- Journal Title
- Physics Letters. A
- Journal Volume
- 338
- Journal Issue
- 3-5
- Journal Page Range
- p. 379-384
- ISSN
- 0375-9601
- CODEN
- PYLAAG
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37034007
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S36: MATERIALS SCIENCE;
- Descriptors DEI
- BINARY ALLOY SYSTEMS; BRILLOUIN ZONES; CRYSTALLIZATION; DISPERSION RELATIONS; GERMANIUM ALLOYS; NANOSTRUCTURES; OSCILLATION MODES; PHONONS; RAMAN SPECTRA; SILICON ALLOYS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- ALLOY SYSTEMS; ALLOYS; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; MICROSCOPY; PHASE TRANSFORMATIONS; QUASI PARTICLES; SCATTERING; SPECTRA; ZONES
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.