Published May 24, 2000
| Version v1
Journal article
Direct methods for surface X-ray diffraction
- 1. Department of Physics and Laboratory for Surface Studies, University of Wisconsin-Milwaukee, P.O. Box 413, Milwaukee, Wisconsin 53201 (United States)
- 2. Institute for Crystallography and Mineralogy, University of Munich, Theresienstrsse 41, 80333 Munich, (Germany)
Description
We develop of a direct method for surface X-ray diffraction that exploits the holographic feature of a known reference wave from the substrate. A Bayesian analysis of the optimal inference to be made from an incomplete data set suggests a maximum entropy algorithm that balances agreement with the data and other statistical considerations
Additional details
Identifiers
- DOI
- 10.1063/1.1303840;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 514
- Journal Issue
- 1
- Journal Page Range
- p. 130-139
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- Workshop on theory and computation for synchrotron radiation spectroscopy
- Acronym
- SRRTNET workshop '99
- Dates
- 23-25 Sep 1999
- Place
- Frascati (Italy)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35060125
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALGORITHMS; BALANCES; CRYSTALLOGRAPHY; ELECTRON DENSITY; ENTROPY; SUBSTRATES; SURFACES; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; MATHEMATICAL LOGIC; MEASURING INSTRUMENTS; PHYSICAL PROPERTIES; SCATTERING; THERMODYNAMIC PROPERTIES; WEIGHT INDICATORS
Optional Information
- Notes
- (c) 2000 American Institute of Physics.