X-ray diffractometers for examining and inspecting stressed-strained materials (review)

The application of modern detectors and automation of measurements based on computers have increased the productivity and accuracy of the x-ray method, which has become an effective means of technological inspection of objects of complicated configuration and arbitrary dimensions. Various recording methods are described in this paper that are used in the goniometric devices of the diffractometers for determining the stresses, including: a fixed detector, parafocusing, Zeeman-Blin method, parallel beam, and side-inclined beam. Work is being continued on the development of x-ray diffractometers for macrostress measurements using computers for automating the process of measurement and processing the experimental data