Published 1984 | Version v1
Report Restricted

Ion beam studies of hydrogen in metals

Description

Methods based on ion implantation and nuclear reaction analysis were used to investigate the behavior of hydrogen isotopes in metals. The binding enthalpy of deuterium (D) at irradiation effects, He bubbles, D2 bubbles, and metal-oxide interfaces was measured for Al, Fe, Ni, Cu, Pd, austenitic stainless steel, Inconel, and amorphous Fe40Ni40P14B6. The binding enthalpies determined for the pure metals are in excellent agreement with mechanistic calculations based on effective-medium theory and other information. Surface-limited release of D from Fe, stainless steel, and Inconel was measured as a function of temperature and the state of surface oxidation. The release rate was accurately proportional to the square of the D concentration in solution, permitting the results to be expressed in terms of a surface recombination coefficient. This quantity was up to four orders of magnitude greater for an ion-sputtered surface than for a surface with electropolish oxide. The diffusion coefficient and solid solubility of tritium in stainless steel were measured for the first time at the ice point, thereby extending downward by three orders of magnitude the diffusivities available from conventional permeation experiments. Deuterium concentration profiles resulting from electrochemical charging of Incoloy 903 were measured as a function of charging current, thereby providing a direct, systematic calibration of such charging in an austenitic material where conventional permeation measurements are precluded by the small hydrogen diffusion rate

Availability note (English)

MF available from INIS under the Report Number; Available from NTIS, PC A03/MF A01; 1 as DE84017422.

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Additional details

Publishing Information

Imprint Pagination
36 p.
Report number
SAND--84-1052C

Conference

Title
International conference on surface modification of metals by ion beams.
Dates
17-21 Sep 1984.
Place
Heidelberg (Germany, F.R.).

Optional Information

Secondary number(s)
CONF-8409130--1.