Published June 2009
| Version v1
Journal article
Dielectric investigations in Sr0.75Ba0.25Nb2O6 relaxor ferroelectric thin films
- 1. Universidade Estadual de Maringa, Grupo de Desenvolvimento de Dispositivos Multifuncionais, Departamento de Fisica, Maringa, PR (Brazil)
- 2. Universidade Federal de Sao Carlos, Grupo de Ceramicas Ferroeletricas, Departamento de Fisica, Sao Carlos, SP (Brazil)
- 3. Universidade Federal de Uberlandia, Grupo de Ferroeletricos e Materiais Multifuncionais, Instituto de Fisica, Uberlandia, MG (Brazil)
- 4. Universidade Estadual Paulista Julio de Mesquita Filho, Grupo de Ferroeletricos e Novos Materiais, Departamento de Fisica e Quimica, Ilha Solteira, SP (Brazil)
Description
The dielectric properties of Sr0.75Ba0.25Nb2O6 relaxor ferroelectric thin films were carefully analyzed. In contrast to bulk samples which present three distinct dielectric relaxation phenomena Sr0.75Ba0.25Nb2O6 thin films present only two of them. The suppression of the third anomaly can be mainly attributed to the narrow grain size distribution of nanograins and weak tensile strains imposed to the film from the substrate. The whole set of results point to the interpretation of a dielectric response characteristic of mesoscopic structure, which is composed of clusters and nanodomains. (orig.)
Availability note (English)
Available from: http://dx.doi.org/10.1007/s00339-008-5060-7Additional details
Identifiers
Publishing Information
- Journal Title
- Applied Physics. A, Materials Science and Processing
- Journal Volume
- 95
- Journal Issue
- 3
- Journal Page Range
- p. 757-760
- ISSN
- 0947-8396
- CODEN
- APAMFC
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 40042765
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; BARIUM COMPOUNDS; DOMAIN STRUCTURE; FERROELECTRIC MATERIALS; GRAIN SIZE; KHZ RANGE 01-100; NANOSTRUCTURES; NIOBATES; PERMITTIVITY; RELAXATION; RELAXATION LOSSES; STRAINS; STRONTIUM COMPOUNDS; SUBSTRATES; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0000-0013 K; TEMPERATURE RANGE 0013-0065 K; TEMPERATURE RANGE 0065-0273 K; TEMPERATURE RANGE 0273-0400 K; TEMPERATURE RANGE 0400-1000 K; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; COHERENT SCATTERING; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; DIFFRACTION; ELECTRICAL PROPERTIES; ENERGY LOSSES; FILMS; FREQUENCY RANGE; KHZ RANGE; LOSSES; MATERIALS; MICROSCOPY; MICROSTRUCTURE; NIOBIUM COMPOUNDS; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; REFRACTORY METAL COMPOUNDS; SCATTERING; SIZE; TEMPERATURE RANGE; TRANSITION ELEMENT COMPOUNDS