Published 1989 | Version v1
Book Metadata-only

Hardness and elastic modulus measurements in CdTe and ZnTe thin film and bulk samples and ZnTe-CdTe superlattices

Creators

  • 1. Dept. of Materials Science, Stanford Univ., Stanford CA (USA)
  • 2. AT ampersand T Bell Laboratories, Homdel, NJ (USA)

Description

Hardness and modulus values of bulk and epilayer ZnTe and CdTe samples and of ZnTe-CdTe superlattices are reported. Both hardness and Young's modulus values increase with increasing ZnTe content in the ZnCdTe samples. Alloying effects and strains in the superlattice structure are proposed to explain the strengthening

Additional details

Publishing Information

Publisher
Materials Research Society.
Imprint Place
Pittsburgh, PA (USA)
ISBN
1-55899-003-8
Imprint Title
Thin films
Imprint Pagination
402 p.
Series
Materials Research Society symposium proceedings. Volume 130.
Journal Page Range
p. 123-128.

Conference

Title
stresses and mechanical properties.
Acronym
Thin films
Dates
28-30 Nov 1988.
Place
Boston, MA (USA).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
21058082
Subject category
S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CADMIUM TELLURIDES; ELASTICITY; HARDNESS; MECHANICAL PROPERTIES; METALLURGY; STRAINS; SUPERLATTICES; THIN FILMS; YOUNG MODULUS; ZINC TELLURIDES
Descriptors DEC
CADMIUM COMPOUNDS; CHALCOGENIDES; FILMS; TELLURIDES; TELLURIUM COMPOUNDS; ZINC COMPOUNDS

Optional Information

Secondary number(s)
CONF-8811222--.