Published December 15, 2007 | Version v1
Journal article

Electron statistics and cluster formation in CdF2 semiconductors with DX-centers

  • 1. St. Petersburg State University of Information Technologies, Mechanics and Optics, St. Petersburg 197101 (Russian Federation)
  • 2. A.F. Ioffe Physico-Technical Institute of RAS, St. Petersburg 194021 (Russian Federation)
  • 3. Oregon State University, Corvallis, OR 97331-6501 (United States)

Description

Equilibrium statistical and nonequilibrium photo-induced distributions of electrons over the levels of CdF2:DX were studied as function of the temperature. Optical, conductivity, as well as 113Cd and 19F nuclear spin-lattice relaxation data were taken into consideration. The heights of the tunneling barriers separating deep and shallow states of bistable DX-centers formed in CdF2 by Ga and In dopants, as well as the ionization energy of the deep states were determined for both dopants. CdF2:Ga semiconductors proved to have very high degree of compensation by interstitial F- ions, K>0.996. Most Ga ions are located in expanded ordered structures (clusters), and may form only shallow one-electron states. Features of these structures result in very narrow impurity band (<0.02 eV) at Ga concentrations up to ∼1020 cm-3, which is responsible for the CdF2:Ga 'free electron' conductivity. The remaining less than 1% of all Ga ions are placed into the 'cluster free' regions of the crystal, and form DX-centers where each center can bind either one, or two electrons. In CdF2:In, an increase of In content up to ∼1019 cm-3 and above results in cluster formation. In contrast with Ga, In ions in clusters form only deep, two-electron states. At high In-doping level (>1 mol%), the concentration of DX-centers (located in the 'cluster free' regions of the crystal) is very small

Availability note (English)

Available from http://dx.doi.org/10.1016/j.physb.2007.08.167

Additional details

Identifiers

DOI
10.1016/j.physb.2007.08.167;
PII
S0921-4526(07)00714-4;

Publishing Information

Journal Title
Physica. B, Condensed Matter
Journal Volume
401-402
Journal Page Range
p. 282-285
ISSN
0921-4526
CODEN
PHYBE3

Conference

Title
24. International conference on defects in semiconductors
Dates
22-27 Jul 2007
Place
Albuquerque, NM (United States)

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.