Application of frequency combs in the measurement of the refractive index of air
Creators
- 1. Max-Planck Research Group, Institute of Optics, Information and Photonics, University Erlangen-Nuremburg, 91058 Erlangen (Germany)
Description
We report a new method in the precision measurement of the refractive index of air using a highly unbalanced Michelson interferometer with a femtosecond optical frequency comb as the light source. Standard dry air is filled into a 30 m multipass cell, serving as the long arm of the interferometer, while a short arm acts as the reference path. Both time and frequency domain interferograms are recorded to measure the refractive index of air. The deviation of our experimental results with Edlen's formula is 1.4x10-9 at 800 nm. Our experiment has a standard error of 5.2x10-9 at fixed parameters (pressure and temperature). This is achieved by putting the multipass cell into a temperature-stabilized box, and also by locking the interferometer path length with a He-Ne laser. We achieved a temperature stabilization of 0.8 mK for 25 h. This corresponds to 0.4 μm multipass cell length change. The locking of the He-Ne interferometer enables us to achieve 7 nm path-length change outside the multipass cell. Combined with accurate measurement of temperature and pressure, we were able to achieve an accuracy of 7.7x10-9
Additional details
Identifiers
- DOI
- 10.1063/1.2239036;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 77
- Journal Issue
- 8
- Journal Page Range
- p. 083104-083104.5
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38026490
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- ACCURACY; AIR; ERRORS; FREQUENCY MEASUREMENT; HELIUM-NEON LASERS; INTERFEROMETRY; LENGTH; LIGHT SOURCES; MICHELSON INTERFEROMETER; REFRACTIVE INDEX; STABILIZATION; VISIBLE RADIATION
- Descriptors DEC
- DIMENSIONS; ELECTROMAGNETIC RADIATION; FLUIDS; GAS LASERS; GASES; INTERFEROMETERS; LASERS; MEASURING INSTRUMENTS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATION SOURCES; RADIATIONS
Optional Information
- Notes
- (c) 2006 American Institute of Physics