Peripheral imperfections and their effects on efficiency in Si(Li) X-ray detectors

The results of scanning a finely collimated beam of 5.9 keV X-rays across the faces of three different Si(Li) X-ray detectors are interpreted in terms of an active area of good charge collection and peripheral regions of incomplete charge collection, both within the manufacturers' stated areas. The data are correlated with absolute efficiencies determined using calibrated radionuclide X-ray emitters. The hazards of spectral artefacts from the imperfect regions in the contexts of XRF and PIXE are stressed. (orig.)