Published April 2006 | Version v1
Journal article Metadata-only

Swift ion irradiation of magnetostrictive multilayers

Creators

  • 1. Groupe de Physique des Materiaux, UMR CNRS 6634, Universite de Rouen, 76801 St Etienne du Rouvray (France)
  • 2. IEMN-UMR 8520, Avenue Poincare, BP 69, 59652 Villeneuve d'Ascq cedex (France)
  • 3. Laboratoire de Magnetisme de Bretagne, CNRS, BP809, 29285 Brest cedex (France)
  • 4. Laboratoire CIRIL, GANIL - Boulevard H. Becquerel, BP5133, 14070 Caen cedex 5 (France)

Description

The modification of the magnetic and magnetostrictive properties of TbFe2/Co exchange-coupled multilayers irradiated with 700 MeV Pb ions was investigated as a function of ion fluence. After irradiation, the magnetostrictive properties of the sample are first strongly improved up to a fluence of 1 x 1012 ions cm-2 where the magnetoelastic susceptibility is six times higher than for the as-deposited sample. This effect is ascribed to stress relaxation and Fe-Co intermixing at the interfaces. For higher fluences, the magnetostrictive properties do not vary further, indicating a stationary state of mixing

Additional details

Identifiers

DOI
10.1016/j.nimb.2005.11.093;
PII
S0168-583X(05)02029-X;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
245
Journal Issue
1
Journal Page Range
p. 157-160
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
6. international symposium on swift heavy ions in matter
Acronym
SHIM 2005
Dates
28-31 May 2005
Place
Aschaffenburg (Germany)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37069745
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
INTERFACES; IRRADIATION; LEAD IONS; MAGNETIC PROPERTIES; MEV RANGE 100-1000; MIXING; STRESS RELAXATION
Descriptors DEC
CHARGED PARTICLES; ENERGY RANGE; IONS; MEV RANGE; PHYSICAL PROPERTIES; RELAXATION

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.