Published July 15, 2015 | Version v1
Journal article

WD-XRA technique in multiphase flow measuring

  • 1. Tomsk Polytechnic University, Lenin Avenue 30, Tomsk 634050 (Russian Federation)
  • 2. Nuclear University MEPhI, Kashirskoye Shosse 31, Moscow 115409 (Russian Federation)
  • 3. INFN Laboratori Nazionali di Frascati, Via E. Fermi 40, 00044 Frascati (Italy)
  • 4. RAS P.N. Lebedev Physical Institute, Lenin Avenue 53, Moscow 119991 (Russian Federation)

Description

A new technique to perform the analysis of multiphase fluid flow based on wave dispersive X-ray absorptiometry is suggested. The numerical simulation and comparison of this technique with currently used approaches are provided and a way to increase the luminosity intensity is found that includes the usage the X-ray focusing optics by a bent crystal and a polycapillary semilens. Based on numerical simulation of radiation spectrum the influence of the bent crystal on the luminosity is evaluated and experimentally shown the advantages of using the multicapillary optics

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2015.02.030

Additional details

Identifiers

DOI
10.1016/j.nimb.2015.02.030;
PII
S0168-583X(15)00147-0;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
355
Journal Page Range
p. 276-280
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
6. international conference on charged and neutral particles channeling phenomena
Acronym
Channeling 2014
Dates
5-10 Oct 2014
Place
Capri (Italy)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
47037565
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COMPUTERIZED SIMULATION; CRYSTALS; FOCUSING; LUMINOSITY; MULTIPHASE FLOW; OPTICS; SPECTRA; X RADIATION
Descriptors DEC
ELECTROMAGNETIC RADIATION; FLUID FLOW; IONIZING RADIATIONS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATIONS; SIMULATION

Optional Information

Copyright
Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.