A new linear array detector for high resolution and low dose digital radiography
Description
At the Department of Physics of the University of Bologna a new intensified linear array detector is under development. The core of the system is a digital intensified CCD camera, the electron bombarded charge coupled device (EBCCD). The main innovation is a coherent rectangular-to-linear fiber optics adapter coupling the 1 in. diameter photocathode of the camera with a linear 129 mm x 1.45 mm strip of Gd2O2S:Tb. In this way a high spatial resolution over an extended length is obtained. The detector works as an X-ray scanner by means of a high-precision translation mechanical device to inspect a 13 cm x 18 cm area. A complete characterisation of the system has been made in terms of linearity, dynamic range, modulation transfer function (MTF), noise power spectrum (NPS) and detective quantum efficiency (DQE). At last, radiographic tests on a set of samples have been made and will be presented
Additional details
Identifiers
- DOI
- 10.1016/S0168-583X(03)01577-5;
- arXiv
- arXiv:hep-ph/0208071v4;
- PII
- S0168583X03015775;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 213
- Journal Issue
- 1
- Journal Page Range
- p. 227-230
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 5. topical meeting on industrial radiation and radioisotope measurement applications
- Dates
- 9-14 Jun 2002
- Place
- Bologna (Italy)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Kazakhstan
- INIS RN
- 35039127
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CAMERAS; CHARGE-COUPLED DEVICES; FIBER OPTICS; IMAGE SCANNERS; QUANTUM EFFICIENCY; RADIATION DETECTORS; RESOLUTION; TRANSFER FUNCTIONS; X-RAY RADIOGRAPHY
- Descriptors DEC
- EFFICIENCY; FUNCTIONS; INDUSTRIAL RADIOGRAPHY; MATERIALS TESTING; MEASURING INSTRUMENTS; NONDESTRUCTIVE TESTING; OPTICS; SEMICONDUCTOR DEVICES; TESTING
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.