Published July 1992 | Version v1
Journal article

Synchrotron x-ray topography studies of twin structures in lanthanum aluminate single crystals

  • 1. Department of Materials Science and Engineering, State University of New York at Stony Brook, Stony Brook, New York 11794-2275 (United States)
  • 2. AT ampersand T Bell Laboratories, Murray Hill, New Jersey 07974 (United States)

Description

An extensive investigation of twin structures in lanthanum aluminate single crystals at room temperature has been undertaken using White Beam Synchrotron X-ray Topography (WBSXRT). Twin configurations, directly observable via orientation contrast, were found to comprise both large-volume, macroscopic twins and thick twin lamellae. Positional shifts of twin domain images with respect to matrix images, arising from the mutual misorientation of diffraction vectors, were measured on x-ray topographic images recorded from the (220)rhom planes approximately parallel to the specimen surface and compared to calculated values in order to solve the twin laws in this system. The dominant twin operations were found to be (101)rhom, (011)rhom, and (112)rhom mirror reflections. The potential influence of the twins on the growth of epitaxial Ba2YCu3O7-δ thin films is discussed

Additional details

Publishing Information

Journal Title
Journal of Materials Research
Journal Volume
7
Journal Issue
7
Journal Page Range
p. 1847-1855.
ISSN
0884-2914
CODEN
JMREEE