Synchrotron x-ray topography studies of twin structures in lanthanum aluminate single crystals
Creators
- 1. Department of Materials Science and Engineering, State University of New York at Stony Brook, Stony Brook, New York 11794-2275 (United States)
- 2. AT ampersand T Bell Laboratories, Murray Hill, New Jersey 07974 (United States)
Description
An extensive investigation of twin structures in lanthanum aluminate single crystals at room temperature has been undertaken using White Beam Synchrotron X-ray Topography (WBSXRT). Twin configurations, directly observable via orientation contrast, were found to comprise both large-volume, macroscopic twins and thick twin lamellae. Positional shifts of twin domain images with respect to matrix images, arising from the mutual misorientation of diffraction vectors, were measured on x-ray topographic images recorded from the (220)rhom planes approximately parallel to the specimen surface and compared to calculated values in order to solve the twin laws in this system. The dominant twin operations were found to be (101)rhom, (011)rhom, and (112)rhom mirror reflections. The potential influence of the twins on the growth of epitaxial Ba2YCu3O7-δ thin films is discussed
Additional details
Publishing Information
- Journal Title
- Journal of Materials Research
- Journal Volume
- 7
- Journal Issue
- 7
- Journal Page Range
- p. 1847-1855.
- ISSN
- 0884-2914
- CODEN
- JMREEE
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 24010033
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINATES; HIGH-TC SUPERCONDUCTORS; LANTHANUM COMPOUNDS; MONOCRYSTALS; SUBSTRATES; SYNCHROTRON RADIATION; TEMPERATURE RANGE 0273-0400 K; TWINNING
- Descriptors DEC
- ALUMINIUM COMPOUNDS; BREMSSTRAHLUNG; CRYSTALS; ELECTROMAGNETIC RADIATION; OXYGEN COMPOUNDS; RADIATIONS; RARE EARTH COMPOUNDS; SUPERCONDUCTORS; TEMPERATURE RANGE