Published December 10, 1998
| Version v1
Journal article
Diamond detectors with subnanosecond time resolution for heavy ion spill diagnostics
- 1. Gesellschaft fuer Schwerionenforschung mbH (GSI), D-64291 Darmstadt (Germany)
- 2. Institut fuer Kernphysik der Johann Wolfgang Goethe-Universitaet, Frankfurt am Main (Germany)
Description
The application of CVD diamonds as radiation-hard particle detectors with outstanding properties for heavy ion beamline diagnostics is presented. Synchrotron particle spills ranging from a single ion to well beyond 108 pps can be analyzed while maintaining single-particle time resolution below fractions of a nanosecond. With segmented electrode structures on the diamond surface, higher particle count rates and improved monitoring of x/y beam profiles can be achieved. Diamond detectors with areas up to 30x30 mm2 for a precise measurement system for beam intensity, beam profiles, and spill time-structure are described
Additional details
Identifiers
- DOI
- 10.1063/1.57055;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 451
- Journal Issue
- 1
- Journal Page Range
- p. 514-521
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 8. beam instrumentation workshop
- Dates
- 4-7 May 1998
- Place
- Stanford, CA (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40072815
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM MONITORING; BEAM POSITION; BEAM PROFILES; CHEMICAL VAPOR DEPOSITION; COUNTING RATES; DATA PROCESSING; DIAMONDS; DIELECTRIC TRACK DETECTORS; ELECTRODES; HEAVY IONS; ION BEAMS; SYNCHROTRONS; TIME RESOLUTION
- Descriptors DEC
- ACCELERATORS; BEAMS; CARBON; CHARGED PARTICLES; CHEMICAL COATING; CYCLIC ACCELERATORS; DEPOSITION; ELEMENTS; IONS; MEASURING INSTRUMENTS; MINERALS; MONITORING; NONMETALS; PROCESSING; RADIATION DETECTORS; RESOLUTION; SURFACE COATING; TIMING PROPERTIES
Optional Information
- Notes
- (c) 1998 American Institute of Physics.