Published April 15, 2009 | Version v1
Journal article

Evolution of the nanostructure of VVER-1000 RPV materials under neutron irradiation and post irradiation annealing

  • 1. Materials Science and Technology Division, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, TN 37831-6136 (United States)
  • 2. Russian Research Center, Kurchatov Institute, Moscow (Russian Federation)

Description

A high nickel VVER-1000 (15Kh2NMFAA) base metal (1.34 wt% Ni, 0.47% Mn, 0.29% Si and 0.05% Cu), and a high nickel (12Kh2N2MAA) weld metal (1.77 wt% Ni, 0.74% Mn, 0.26% Si and 0.07% Cu) have been characterized by atom probe tomography to determine the changes in the microstructure during neutron irradiation to high fluences. The base metal was studied in the unirradiated condition and after neutron irradiation to fluences between 2.4 and 14.9 x 1023 m-2 (E > 0.5 MeV), and the weld metal was studied in the unirradiated condition and after neutron irradiation to fluences between 2.4 and 11.5 x 1023 m-2 (E > 0.5 MeV). High number densities of ∼2-nm-diameter Ni-, Si- and Mn-enriched nanoclusters were found in the neutron irradiated base and weld metals. No significant copper enrichment was associated with these nanoclusters and no copper-enriched precipitates were observed. The number densities of these nanoclusters correlate with the shifts in the ΔT41J ductile-to-brittle transition temperature. These nanoclusters were present after a post irradiation anneal of 2 h at 450 deg. C, but had dissolved into the matrix after 24 h at 450 deg. C. Phosphorus, nickel, silicon and to a lesser extent manganese were found to be segregated to the dislocations.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jnucmat.2009.01.299

Additional details

Identifiers

DOI
10.1016/j.jnucmat.2009.01.299;
PII
S0022-3115(09)00322-5;

Publishing Information

Journal Title
Journal of Nuclear Materials
Journal Volume
385
Journal Issue
3
Journal Page Range
p. 615-622
ISSN
0022-3115
CODEN
JNUMAM

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.