Published April 1992
| Version v1
Journal article
Absolute calibration of semiconductor detector with an impulse 'vacuum spark'-type source of X-ray with energies E=0.9-1.5 keV
- 1. Gosudarstvennyj Komitet po Ispol'zovaniyu Atomnoj Ehnergii SSSR, Moscow (Russian Federation). Inst. Atomnoj Ehnergii
Description
Results of absolute calibration of silicon semiconductor detector (SSD) with pulse 'vacuum spark'-type source within the range of quanta energies of E=0.9-1.5 keV are presented. Irradiation of plasma, consisting of multicharged copper ions was used in the study. Multilayer mirror (tungsten-carbon) was applied in a monochromator. The methodology described makes it possible to carry out time and spectral calibration of various SSDs, possessing sensitivity not less than 10-19 Klxcm2/quantum, and also other elements of roentgen apparatus
Additional details
Additional titles
- Original title (Russian)
- Абсолютная калибровка ППД на импульсном рентгеновском источнике типа «вакуумная искра» в диапазоне энергий квантов E = 0,9–1,5 кэВ
Publishing Information
- Journal Title
- Fizika Plazmy
- Journal Volume
- 18
- Journal Issue
- 4
- Journal Page Range
- p. 514-516.
- ISSN
- 0367-2921
- CODEN
- FIPLDK
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- Russian Federation
- INIS RN
- 24055716
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- CALIBRATION; EMISSION SPECTRA; KEV RANGE 100-1000; PLASMA DIAGNOSTICS; SEMICONDUCTOR DETECTORS; SOFT X RADIATION; X-RAY SPECTROSCOPY
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; ENERGY RANGE; IONIZING RADIATIONS; KEV RANGE; MEASURING INSTRUMENTS; RADIATION DETECTORS; RADIATIONS; SPECTRA; SPECTROSCOPY; X RADIATION