Analysis of solids by electrons, ions, and X-rays

The monography deals with methods for analyzing solids using electrons, ions, or X-rays for exciting and detecting the physical process which renders possible the analysis. The following methods are described in detail: X-ray diffraction; X-ray topography; X-ray fluorescence analysis; electron beam microanalysis; high-resolution X-ray spectroscopy; analysis of solids by ion-induced X radiation; high energy electron diffraction; low energy electron diffraction; transmission electron microscopy; scanning electron microscopy; field emission microscopy; electron spectroscopy; Anger electron spectroscopy; photoelectron spectroscopy; ion-induced electron emission; ion scattering analysis; ion beam analysis; secondary ion mass spectroscopy; electron stimulated ion desorption; and computer control, data aquisition, and evaluation of the measurements. For each method the basic principle, the theoretical fundamentals, the experimental technique, applications, and references are given