Published September 1977 | Version v1
Book

Low energy ion-surface scattering - physics and applications

  • 1. Max-Planck-Institut fuer Plasmaphysik, Garching/Muenchen (Germany, F.R.)

Description

This paper reviews some recent developments in low energy ion scattering, i.e. the spectrometry of noble gas ions of about 100 to 2000 eV backscattered from solid surfaces. From the physical processes involved the neutralization at the surface and in particular the oscillatory structure in the energy dependence of scattered ion yields has prompted a number of investigations. The interpretation of these structures by quasiresonant charge transfer in binary collisions seems to be established. Some sensitivity to the chemical environment is found. Ion scattering has a particular potential for the analysis of adsorption layers. Surface structures and positions of adsorbed atoms and molecules have been investigated by this method. Examples are given in which its specific surface sensitivity and the corresponding shadowing effects are utilized. (Auth.)

Additional details

Publishing Information

Publisher
Oesterr. Studiengesellschaft fuer Atomenergie G.m.b.H.
Imprint Place
Vienna, Austria
Imprint Title
Proceedings of the seventh international vacuum congress and the third international conference on solid surfaces. Volume 3
Journal Page Range
p. 2495-2501.

Conference

Title
7. international vacuum congress and 3. international conference on solid surfaces.
Dates
12 - 16 Sep 1977.
Place
Vienna, Austria.

INIS

Country of Publication
Austria
Country of Input or Organization
Austria
INIS RN
9368884
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ADSORPTION; BACKSCATTERING; CHARGE EXCHANGE; ENERGY DEPENDENCE; ENERGY SPECTRA; EV RANGE 100-1000; ION BEAMS; ION SCATTERING ANALYSIS; KEV RANGE 01-10; REVIEWS; SURFACES
Descriptors DEC
BEAMS; CHEMICAL ANALYSIS; DOCUMENT TYPES; ENERGY RANGE; EV RANGE; KEV RANGE; NONDESTRUCTIVE ANALYSIS; SCATTERING; SPECTRA