Published July 11, 2003
| Version v1
Journal article
Bunch length and phase stability measurements at the TESLA test facility
Description
Electron bunch lengths and time jitters have been measured with sub-ps resolution at the TESLA Test Facility at DESY. Synchrotron radiation emitted from a dipole magnet reflects the longitudinal charge distribution of the electron bunch and can also be used as a timing reference of the radiation pulses produced by the free-electron laser. For sub-ps time resolution, dispersion effects of the spectrally broad-band synchrotron radiation have to be suppressed. The phase stability of the FEL pulses with respect to the radio-frequency master oscillator has been studied with a streak camera operating in synchroscan mode
Additional details
Identifiers
- PII
- S0168900203009410;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 507
- Journal Issue
- 1-2
- Journal Page Range
- p. 335-339
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 24. international free electron laser conference; 9. FEL users workshop
- Acronym
- FEL 2002
- Dates
- 9-13 Sep 2002
- Place
- Argonne, IL (United States)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35021473
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM BUNCHING; BEAM DYNAMICS; DESY; ELECTRON BEAMS; FAR ULTRAVIOLET RADIATION; FREE ELECTRON LASERS; SYNCHROTRON RADIATION; TEST FACILITIES; TIME RESOLUTION; X-RAY SOURCES
- Descriptors DEC
- ACCELERATORS; BEAM DYNAMICS; BEAMS; BREMSSTRAHLUNG; CYCLIC ACCELERATORS; DYNAMICS; ELECTROMAGNETIC RADIATION; LASERS; LEPTON BEAMS; MECHANICS; PARTICLE BEAMS; RADIATION SOURCES; RADIATIONS; RESOLUTION; SYNCHROTRONS; TIMING PROPERTIES; ULTRAVIOLET RADIATION
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.