Published January 10, 1997 | Version v1
Journal article

Group III-Nitride materials growth using gas source molecular beam epitaxy

  • 1. IONWERKS 2472 Bolsover, Suite 255 Houston, Texas 77005 (United States)
  • 2. Space Vacuum Epitaxy Center/University of Houston 2400 Calhoun Rm 724 Houston, Texas 77204 (United States)
  • 3. Wright Laboratory and MLBM Bldg 652 Rm 133 2941 P. Street, Suite 1 Wright-Patterson AFB, Ohio 45433-7750 (United States)

Description

Group III-Nitride materials, such as GaN, AlN, and CN have applications in a number of areas which are relevant to both earth and space based industries. Their successful development will allow for devices which withstand operation in extreme environments (>500 deg. C) and optoelectronic systems sensitive in the blue to UV range of the electromagnetic spectrum. In the past few years, at SVEC, we have developed a number of growth and characterization tools that are tailored to the synthesis of these nitride materials. As a result we have synthesized BN, CN, and GaN using both ion beam assisted deposition and gas source molecular beam epitaxy (GS-MBE) with both nitrogen and ammonia. In this presentation we will describe the instrumentation developed as part of this program and present results for the thin films synthesized by these methods. In particular, the investigation of the onset of heteroepitaxy and growth of GaN films on various substrates will be presented using the ion scattering techniques in-situ time of flight direct recoil spectroscopy (TOF-DRS) and mass spectroscopy of recoiled ions (MSRI) and reflection high energy electron diffraction (RHEED)

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
387
Journal Issue
1
Journal Page Range
p. 791-800
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
Space technology and applications international forum
Acronym
STAIF-97
Dates
26-30 Jan 1997
Place
Albuquerque, NM (United States)

Optional Information

Notes
(c) 1997 American Institute of Physics.