Published April 1, 1986
| Version v1
Journal article
Experiments on intrinsic and thermally induced chaos in an rf-driven Josephson junction
Creators
- 1. IBM Research, PO Box 218, Yorktown Heights, New York 10598
Description
We report detailed measurements of low-frequency noise due to microwaves applied to a real Josephson tunnel junction. An intrinsically chaotic region is apparently identified, but the effects of thermal noise are shown to be significant. In particular we show experimental data that we interpret as evidence for thermally activated hopping and thermally affected chaos. The data are only in qualitative accord with recent ideas regarding the effect of thermal noise on intermittent chaos
Additional details
Publishing Information
- Journal Title
- Phys. Rev., B: Condens. Matter
- Journal Volume
- 33
- Journal Issue
- 7
- Series
- Phys. Rev., B: Condens. Matter.
- Journal Page Range
- 5127-5130
- ISSN
- 0163-1829
- CODEN
- PRBMD
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 17048987
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- JOSEPHSON JUNCTIONS; LEAD; MICROWAVE RADIATION; NIOBIUM; NIOBIUM OXIDES; TEMPERATURE NOISE
- Descriptors DEC
- CHALCOGENIDES; ELECTROMAGNETIC RADIATION; ELEMENTS; METALS; NIOBIUM COMPOUNDS; NOISE; OXIDES; OXYGEN COMPOUNDS; RADIATIONS; SEMICONDUCTOR JUNCTIONS; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS