Effects of coating process on the characteristics of Ag-SnO2 contact materials
- 1. Department of Physics and Materials Science, City University of Hong Kong, Kowloon, Hong Kong (China)
- 2. School of Materials Science and Engineering, Tianjin University, Tianjin 300072 (China)
Description
Good wettability between the SnO2 and silver matrix can improve the electrical contact performance of Ag-SnO2 materials. In this work, Ag was deposited onto the surface of Ti-doped SnO2 particles using chemical plating to enhance the wettability. X-ray diffraction (XRD) and transmission electron microscopy (TEM) were used to characterize the Ag-coated SnO2 particles. Scanning electron microscopy (SEM), conductivity tests, differential thermal analysis (DTA), and thermogravimetric analysis (TGA) were performed on the Ag-SnO2 materials. Our results reveal that the chemical plating process can enhance the wettability between the Ti-doped SnO2 particles and Ag matrix, and the Ag-coated SnO2 particles are uniformly distributed in the Ag matrix. Both the thermal and electrical conductivity of the Ag-SnO2 materials are significantly improved
Additional details
Identifiers
- DOI
- 10.1016/j.matchemphys.2005.09.067;
- PII
- S0254-0584(05)00697-8;
Publishing Information
- Journal Title
- Materials Chemistry and Physics
- Journal Volume
- 98
- Journal Issue
- 2-3
- Journal Page Range
- p. 477-480
- ISSN
- 0254-0584
- CODEN
- MCHPDR
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38079239
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- DIFFERENTIAL THERMAL ANALYSIS; DOPED MATERIALS; ELECTRIC CONDUCTIVITY; ELECTRIC CONTACTS; PLATING; SCANNING ELECTRON MICROSCOPY; SILVER; THERMAL GRAVIMETRIC ANALYSIS; TIN OXIDES; TRANSMISSION ELECTRON MICROSCOPY; WETTABILITY; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL ANALYSIS; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; ELECTRICAL EQUIPMENT; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ELEMENTS; EQUIPMENT; GRAVIMETRIC ANALYSIS; MATERIALS; METALS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; QUANTITATIVE CHEMICAL ANALYSIS; SCATTERING; SURFACE COATING; THERMAL ANALYSIS; TIN COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.