Published September 2003 | Version v1
Journal article

The half-life of 76As

  • 1. National Institute of Standards and Technology, Gaithersburg, MD (United States). Analytical Chemistry Div.
  • 2. Delft Technology Univ. (Netherlands). Interfaculty Reactor Inst.
  • 3. Michigan Univ., Ann Arbor, MI (United States). Dept. of Nuclear Engineering and Radiological Sciences

Description

In the course of making high-accuracy measurements of arsenic, we found that the most recently published and compiled half-life of 76As did not agree with our data as well as the earlier accepted value. To redetermine this parameter, 76As sources were measured on four Ge gamma detector systems, and an exponential function was fitted to the decay data by two different nonlinear least-squares methods. T1/2 = 1.09379 days with a standard uncertainty of 0.00045 days was obtained. This result is 1.5% higher than the most recent value, but is in agreement with the older, less precise, consensus value. (author)

Additional details

Publishing Information

Journal Title
Journal of Radioanalytical and Nuclear Chemistry
Journal Volume
257
Journal Issue
3
Journal Page Range
p. 489-491
ISSN
0236-5731
CODEN
JRNCDM

Conference

Title
3. International k_0-users Workshop
Dates
23-28 Sep 2001
Place
Bruges (Belgium)

Optional Information

Notes
13 refs.