Published April 1, 2005
| Version v1
Journal article
Lessons learned from the BaBar Silicon Vertex Tracker
Creators
- 1. Istituto Nazionale di Fisica Nucleare, Universita degli Studi di Pisa e, sez. di Pisa (Italy)
Description
The Silicon Vertex Tracker (SVT) of the BABAR experiment at the PEP-II asymmetric B factory consists of a five-layer double sided, AC coupled silicon microstrip detector. It represents a key element to measure with precision the decay position of B mesons, satisfying the severe constraints imposed by the accelerator design, in terms of geometry of the interaction region and conditions of operation. In the following paper, a critical review of the SVT general design and performance is made, with special attention to those details of the design and the assembly procedure that are considered a source of possible problems given the experience accumulated during the construction, the commissioning and the first 5 years of operation
Additional details
Identifiers
- DOI
- 10.1016/j.nima.2005.01.039;
- PII
- S0168-9002(05)00051-3;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 541
- Journal Issue
- 1-2
- Journal Page Range
- p. 67-72
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 5. international symposium on development and application of semiconductor tracking detectors
- Acronym
- STD 5
- Dates
- 14-17 Jun 2004
- Place
- Hiroshima (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37033545
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCELERATORS; ACCURACY; ASYMMETRY; B MESONS; DAMAGE; DESIGN; GEOMETRY; LAYERS; PARTICLE DECAY; PERFORMANCE; SI MICROSTRIP DETECTORS
- Descriptors DEC
- BEAUTY MESONS; BEAUTY PARTICLES; BOSONS; DECAY; ELEMENTARY PARTICLES; HADRONS; MATHEMATICS; MEASURING INSTRUMENTS; MESONS; PSEUDOSCALAR MESONS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.