Published November 1987
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Applications of the lateral shearing interferometer in measurement of synchrotron radiation optical elements
Description
The use of a single plate shearing, or Murty, interferometer for measuring the surface quality of several optical elements is reviewed and several results are given. The principle of the Murty interferometer is also explained
Availability note (English)
Available from NTIS, PC A03/MF A01; 1 as DE88005184.Files
19073366.pdf
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Additional details
Publishing Information
- Imprint Pagination
- 20 p.
- Report number
- BNL--40626
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 19073366
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- INTERFEROMETERS; OPTICAL SYSTEMS; PLATES; SYNCHROTRON RADIATION; TESTING; USES
- Descriptors DEC
- BREMSSTRAHLUNG; ELECTROMAGNETIC RADIATION; MEASURING INSTRUMENTS; RADIATIONS
Optional Information
- Notes
- Portions of this document are illegible in microfiche products.