Published March 1993 | Version v1
Journal article Metadata-only

The intensity patterns with a multi-crystal diffractometer observed at a synchrotron source

Creators

  • 1. Technion-Israel Inst. of Tech., Dept. of Physics, Haifa (Israel)
  • 2. Clarendon Lab., Univ. of Oxford (United Kingdom)

Description

The intensity is calculated employing the expressions developed for a multi-crystal diffractometer. Comparison with the measurements shows the reliability of the formalism and enables better interpretation of the experimental results. (orig.)

Additional details

Publishing Information

Journal Title
Zeitschrift fuer Naturforschung. A: Physical Sciences
Journal Volume
48
Journal Issue
3
Journal Page Range
p. 519-522.
ISSN
0932-0784
CODEN
ZNASEI

INIS

Country of Publication
Germany
Country of Input or Organization
Germany
INIS RN
25020192
Subject category
S73: NUCLEAR PHYSICS AND RADIATION PHYSICS;
Descriptors DEI
BRAGG REFLECTION; CRYSTAL STRUCTURE; INTEGRAL EQUATIONS; OPTICAL SYSTEMS; SYNCHROTRON RADIATION; WAVELENGTHS; X-RAY DIFFRACTION; X-RAY DIFFRACTOMETERS
Descriptors DEC
BREMSSTRAHLUNG; COHERENT SCATTERING; DIFFRACTION; DIFFRACTOMETERS; ELECTROMAGNETIC RADIATION; EQUATIONS; MEASURING INSTRUMENTS; RADIATIONS; REFLECTION; SCATTERING