Interface confinement on the exciton recombination in thin CdS/ZnO shell/core nanowires
Creators
- 1. Key Laboratory of Low‑Dimensional Quantum Structures and Quantum Control of Ministry of Education, Key Laboratory for Matter Microstructure and Function of Hunan Province, Synergetic Innovation Center for Quantum Effects and Applications (SICQEA), Hunan Normal University, Changsha (China)
- 2. College of Science, Guangdong University of Petrochemical Technology, Maoming (China)
Description
The modulation of exciton recombination is one of the core issues for the electronic/optoelectronic devices. Here, we investigate the exciton recombination and surface depletion of ZnO nanowires under various interface conditions in terms of continuum medium mechanics and bond relaxation method. We find that the enhancement of donor concentration, nanowire dimension and external temperature can modify the carrier recombination, surface barrier height and surface depletion depth. Moreover, coated a thin epitaxial layer on the nanowires is of great benefit to reduce the surface state for suppression of recombination rate. The related mechanism on the interface confinement has also been clarified. Our predictions agree well with the experimental measurements, which provide an effective guidance for the organization of electronic device design.
Availability note (English)
Available from: http://dx.doi.org/10.1007/s00339-020-03676-2Additional details
Identifiers
Publishing Information
- Journal Title
- Applied Physics. A, Materials Science and Processing (Print)
- Journal Volume
- 126
- Journal Issue
- 7
- Journal Page Range
- p. 1-7
- ISSN
- 0947-8396
- CODEN
- APAMFC
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 51092400
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- CADMIUM SULFIDES; CONFINEMENT; EXCITONS; INTERFACES; LAYERS; NANOCOMPOSITES; NANOWIRES; RECOMBINATION; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0013-0065 K; TEMPERATURE RANGE 0065-0273 K; TEMPERATURE RANGE 0273-0400 K; TEMPERATURE RANGE 0400-1000 K; ZINC OXIDES
- Descriptors DEC
- CADMIUM COMPOUNDS; CHALCOGENIDES; INORGANIC PHOSPHORS; MATERIALS; NANOMATERIALS; NANOSTRUCTURES; OXIDES; OXYGEN COMPOUNDS; PHOSPHORS; QUASI PARTICLES; SULFIDES; SULFUR COMPOUNDS; TEMPERATURE RANGE; ZINC COMPOUNDS
Optional Information
- Notes
- AID: 485