Optical imaging of antiferromagnetic domains in ultrathin CoO(001) films
- 1. Department of Physics and State Key Laboratory of Surface Physics, Fudan University, Shanghai 200433 (China)
- 2. Department of Physics, University of California, Davis, California 95616 (United States)
Description
Antiferromagnetic (AFM) domains in ultrathin CoO(001) films are imaged by a wide-field optical microscopy using magneto-optical birefringence effect. The magnetic origin of observed optical contrast is confirmed by the spin orientation manipulation through exchange coupling in Fe/CoO(001) bilayer. The finite size effect of ordering temperature for ultrathin single crystal CoO film is revealed by the thickness and temperature dependent measurement of birefringence contrast. The magneto-optical birefringence effect is found to strongly depend on the photon energy of incident light, and a surprising large polarization rotation angle up to 168.5 mdeg is obtained from a 4.6 nm CoO film with a blue light source, making it possible to further investigate the evolution of AFM domains in AFM ultrathin film under external field. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1367-2630/aba1b4Additional details
Identifiers
Publishing Information
- Journal Title
- New Journal of Physics
- Journal Volume
- 22
- Journal Issue
- 8
- Journal Page Range
- [8 p.]
- ISSN
- 1367-2630
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52052559
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ANTIFERROMAGNETISM; ATOMIC FORCE MICROSCOPY; BIREFRINGENCE; COBALT OXIDES; COUPLING; MONOCRYSTALS; NANOFILMS; OPTICAL MICROSCOPY; PHOTONS; POLARIZATION; SPIN ORIENTATION; TEMPERATURE DEPENDENCE
- Descriptors DEC
- BOSONS; CHALCOGENIDES; COBALT COMPOUNDS; CRYSTALS; ELEMENTARY PARTICLES; FILMS; MAGNETISM; MASSLESS PARTICLES; MATERIALS; MICROSCOPY; NANOMATERIALS; ORIENTATION; OXIDES; OXYGEN COMPOUNDS; REFRACTION; THIN FILMS; TRANSITION ELEMENT COMPOUNDS