Published February 5, 2002 | Version v1
Journal article

Cryogenic detector systems for materials analysis

  • 1. CSP Cryogenic Spectrometers GmbH, Bahnhofstr. 18A, 85737 Ismaning (Germany)
  • 2. Technische Universitaet Muenchen, Physik Department E15, 85747 Garching (Germany)
  • 3. Infineon Technologies AG, Failure Analysis FA5, Munich (Germany)
  • 4. EDAX Inc., 91 McKee Drive, Mahwah, New Jersey 07430 (United States)

Description

The need to analyze small amounts of materials on surfaces e.g. in semiconductor industry drives the development of high resolution X-ray spectrometers based on superconducting detector technology. Since low excitation energies needed for high spatial resolution in Field Emission Scanning Electron Microscopes (FESEM) yield only X-ray lines in the lower part of the X-ray spectrum (<5 keV), line overlaps become a serious issue in the spectral analysis. This problem can be overcome with superconducting detector technology having better energy resolution and thus the ability to separate X-ray lines of important material combinations. For industrial applications the cooling system for the superconducting sensor plays an important role, since liquid coolants are not desirable in clean room environments. This work will cover the basic needs of the materials analyst as well as the practical implementation of superconducting X-ray spectrometers for industrial applications

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
605
Journal Issue
1
Journal Page Range
p. 353-358
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
9. international workshop on low temperature detectors
Dates
22-27 Jul 2001
Place
Madison, WI (United States)

Optional Information

Notes
(c) 2002 American Institute of Physics.