Cryogenic detector systems for materials analysis
Creators
- 1. CSP Cryogenic Spectrometers GmbH, Bahnhofstr. 18A, 85737 Ismaning (Germany)
- 2. Technische Universitaet Muenchen, Physik Department E15, 85747 Garching (Germany)
- 3. Infineon Technologies AG, Failure Analysis FA5, Munich (Germany)
- 4. EDAX Inc., 91 McKee Drive, Mahwah, New Jersey 07430 (United States)
Description
The need to analyze small amounts of materials on surfaces e.g. in semiconductor industry drives the development of high resolution X-ray spectrometers based on superconducting detector technology. Since low excitation energies needed for high spatial resolution in Field Emission Scanning Electron Microscopes (FESEM) yield only X-ray lines in the lower part of the X-ray spectrum (<5 keV), line overlaps become a serious issue in the spectral analysis. This problem can be overcome with superconducting detector technology having better energy resolution and thus the ability to separate X-ray lines of important material combinations. For industrial applications the cooling system for the superconducting sensor plays an important role, since liquid coolants are not desirable in clean room environments. This work will cover the basic needs of the materials analyst as well as the practical implementation of superconducting X-ray spectrometers for industrial applications
Additional details
Identifiers
- DOI
- 10.1063/1.1457662;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 605
- Journal Issue
- 1
- Journal Page Range
- p. 353-358
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 9. international workshop on low temperature detectors
- Dates
- 22-27 Jul 2001
- Place
- Madison, WI (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35081608
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CALORIMETERS; CALORIMETRY; COOLANTS; COOLING SYSTEMS; CRYOGENICS; ELECTRON MICROSCOPES; ENERGY RESOLUTION; FIELD EMISSION; KEV RANGE 01-10; MATERIALS TESTING; SCANNING ELECTRON MICROSCOPY; SPATIAL RESOLUTION; SUPERCONDUCTING DEVICES; X-RAY DETECTION; X-RAY SPECTRA; X-RAY SPECTROMETERS
- Descriptors DEC
- DETECTION; ELECTRON MICROSCOPY; EMISSION; ENERGY RANGE; ENERGY SYSTEMS; KEV RANGE; MEASURING INSTRUMENTS; MICROSCOPES; MICROSCOPY; RADIATION DETECTION; RESOLUTION; SPECTRA; SPECTROMETERS; TESTING
Optional Information
- Notes
- (c) 2002 American Institute of Physics.