Published January 26, 2009 | Version v1
Journal article

Simulation and testing of a lateral, microfabricated electron-impact ion source

  • 1. Department of Electrical and Computer Engineering, Duke University, Durham, North Carolina 27708 (United States)
  • 2. Center for Materials and Electronic Technologies, RTI International, Research Triangle Park, North Carolina 27709 (United States)

Description

Simulation and experimental testing of a miniaturized, lateral, electron-impact ionization source are reported. Modeling and subsequent optimization of the device design led to a tenfold improvement in the performance of the device in comparison with earlier designs. Increased electron current contributing to ionization and increased ion collection efficiency are believed to be the main factors responsible for this improvement. SIMION software was used to model the behavior of the devices and understand the improvement in performance. The ion source can operate in a wide pressure range from 0.1 to 100 mTorr and generate ion currents in excess of 1 μA

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
94
Journal Issue
4
Journal Page Range
p. 044109-044109.3
ISSN
0003-6951
CODEN
APPLAB

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40051317
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S43: PARTICLE ACCELERATORS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
COMPUTER CODES; ELECTRON BEAMS; ION SOURCES; IONIZATION; OPTIMIZATION; PERFORMANCE; PRESSURE RANGE PA
Descriptors DEC
BEAMS; LEPTON BEAMS; PARTICLE BEAMS; PRESSURE RANGE

Optional Information

Notes
(c) 2009 American Institute of Physics