Published January 26, 2009
| Version v1
Journal article
Simulation and testing of a lateral, microfabricated electron-impact ion source
Creators
- 1. Department of Electrical and Computer Engineering, Duke University, Durham, North Carolina 27708 (United States)
- 2. Center for Materials and Electronic Technologies, RTI International, Research Triangle Park, North Carolina 27709 (United States)
Description
Simulation and experimental testing of a miniaturized, lateral, electron-impact ionization source are reported. Modeling and subsequent optimization of the device design led to a tenfold improvement in the performance of the device in comparison with earlier designs. Increased electron current contributing to ionization and increased ion collection efficiency are believed to be the main factors responsible for this improvement. SIMION software was used to model the behavior of the devices and understand the improvement in performance. The ion source can operate in a wide pressure range from 0.1 to 100 mTorr and generate ion currents in excess of 1 μA
Additional details
Identifiers
- DOI
- 10.1063/1.3046733;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 94
- Journal Issue
- 4
- Journal Page Range
- p. 044109-044109.3
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40051317
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S43: PARTICLE ACCELERATORS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- COMPUTER CODES; ELECTRON BEAMS; ION SOURCES; IONIZATION; OPTIMIZATION; PERFORMANCE; PRESSURE RANGE PA
- Descriptors DEC
- BEAMS; LEPTON BEAMS; PARTICLE BEAMS; PRESSURE RANGE
Optional Information
- Notes
- (c) 2009 American Institute of Physics