Published September 25, 2013
| Version v1
Journal article
High-performance and operationally stable organic thin-film transistors using bi-buffer layers with low-cost electrodes
- 1. Department of Electronic Engineering, College of Communication and Electronics, Chongqing University, Chongqing 400044 (China)
- 2. Chongqing Normal University, 400047 (China)
- 3. State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Optoelectronic Information, University of Electronic Science and Technology of China (UESTC), Chengdu 610054 (China)
- 4. Department of Chemistry and the Materials Research Center, Northwestern University, 2145 Sheridan Road, Evanston, IL, 60208,USA (United States)
Description
We report a copper (Cu)-based source/drain (S/D) electrodes organic thin-film transistor (OTFT) with bi-buffer layer structure consisting of firstly a CuOx layer and secondly MoO3 layer. Comparing with single Cu s/d electrodes OTFTs, bi-buffer layer devices not only exhibit enhanced mobilities by more than five times, but also show an improvement of operation stability. The performance enhancement is attributed to improvement of interfacial properties between organic active layer and Cu s/d electrodes, which was analysed by x-ray photoelectron spectroscopy and contact resistance. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0022-3727/46/38/385104Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. D, Applied Physics
- Journal Volume
- 46
- Journal Issue
- 38
- Journal Page Range
- [6 p.]
- ISSN
- 0022-3727
- CODEN
- JPAPBE
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45035423
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BUFFERS; COPPER; COPPER OXIDES; ELECTRODES; LAYERS; MOBILITY; MOLYBDENUM OXIDES; PERFORMANCE; STABILITY; THIN FILMS; TRANSISTORS; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHALCOGENIDES; COPPER COMPOUNDS; ELECTRON SPECTROSCOPY; ELEMENTS; FILMS; METALS; MOLYBDENUM COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; REFRACTORY METAL COMPOUNDS; SEMICONDUCTOR DEVICES; SPECTROSCOPY; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS