Published October 2010 | Version v1
Journal article

Elastic strain around needle-shaped particles embedded in Al matrix

  • 1. CEMES - CNRS, 29 rue Jeanne Marvig, BP 94347, 31055 Toulouse cedex 04 (France)
  • 2. SIMAP, INP Grenoble - CNRS-UJF, BP 75, 38402 Saint Martin d'Heres cedex (France)

Description

Precise measurements of strain fields around precipitates embedded in a crystalline matrix were performed, and simple but accurate models were deduced from the observations. The measurements were carried out in an aged aluminum alloy containing needle-shaped particles. The displacement and strain fields around rod-shaped and lath-shaped particles were obtained from high-resolution electron micrographs using geometric phase analysis. The measurements reveal that strain field of a rod-shaped particle is well described by the classical Eshelby analytical elastic solution. For the more complex case of lath precipitates, it is shown that the strain field in the matrix can be simply approximated by a dislocations dipole. The methods developed are generally applicable to the characterization of strain in nano-structured materials, including those with complex or unknown structures.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.actamat.2010.06.053

Additional details

Identifiers

DOI
10.1016/j.actamat.2010.06.053;
PII
S1359-6454(10)00418-0;

Publishing Information

Journal Title
Acta Materialia
Journal Volume
58
Journal Issue
17
Journal Page Range
p. 5782-5788
ISSN
1359-6454
CODEN
ACMAFD

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43039382
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ALUMINIUM ALLOYS; COMPLEXES; DISLOCATIONS; ELECTRON MICROSCOPY; ELECTRONS; MATERIALS; NANOSTRUCTURES; PARTICLES; PHASE STUDIES; PRECIPITATION; RESOLUTION; SIMULATION; STRAINS
Descriptors DEC
ALLOYS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELEMENTARY PARTICLES; FERMIONS; LEPTONS; LINE DEFECTS; MICROSCOPY; SEPARATION PROCESSES

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.