Published November 1985
| Version v1
Journal article
Moessbauer spectra, obtained with secondary radiation
Description
Moessbauer spectra recorded in the backscattering 2π-geometry by different types of secondary radiation: X-ray resonance-scattered Moessbauer as well as conversion and Auger-electrons are studied. Analytical expressions for spectrum parameters: intensity, square and spectral line width are obtained. The considered approximations of thick and thin scatters can be used depending on the realized experimental situation. Reference data which simplify application of the results obtained are presented
Additional details
Additional titles
- Original title (Russian)
- Регистрация мессбауэровских спектров по вторичному излучению
Publishing Information
- Journal Title
- Zh. Tekh. Fiz.
- Journal Volume
- 55
- Journal Issue
- 11
- Series
- Zh. Tekh. Fiz.
- Journal Page Range
- 2196-2206
- ISSN
- 0044-4642
- CODEN
- ZTEFA
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- USSR
- INIS RN
- 17089929
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ABSORPTION SPECTRA; ANALYTICAL SOLUTION; AUGER EFFECT; ELECTRONS; GAMMA RADIATION; INTERNAL CONVERSION; LINE WIDTHS; MOESSBAUER EFFECT; RADIATION DETECTION; SCATTERING; X RADIATION
- Descriptors DEC
- CONVERSION; DECAY; DETECTION; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; FERMIONS; IONIZING RADIATIONS; LEPTONS; NUCLEAR DECAY; RADIATIONS; SPECTRA
Optional Information
- Notes
- For English translation see the journal Soviet Physics - Technical Physics (USA).