Cluster size dependence of surface morphology after gas cluster ion bombardments
Creators
- 1. Incubation center, University of Hyogo, 2167 Shosha, Himeji, Hyogo 671-2280 (Japan)
Description
Cluster size dependence of the surface morphology of gold was investigated using a size-selected gas cluster ion irradiation system equipped with a strong permanent magnet. In addition to the cluster size effects, the incident angle dependence of surface morphology was studied. At normal incidence, a gold surface was smoothed after irradiation with any size of cluster ions. At the incident angle of 45 deg. and 60 deg., ripples with wavelength of several hundreds of nanometers were formed; however, there was no significant cluster size dependence of ripple structures. When the incident angle was increased to 70 deg. or 80 deg., the direction of the ripples became parallel to the incident angles and the cluster size dependence became remarkable
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2008.03.039Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2008.03.039;
- PII
- S0168-583X(08)00307-8;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 266
- Journal Issue
- 10
- Journal Page Range
- p. 2529-2532
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 9. European conference on accelerators in applied research and technology
- Acronym
- ECAART-9
- Dates
- 3-7 Sep 2007
- Place
- Florence (Italy)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40009594
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- GOLD; ION PAIRS; IRRADIATION; MODIFICATIONS; MORPHOLOGY; PERMANENT MAGNETS; SURFACES; WAVELENGTHS
- Descriptors DEC
- ELEMENTS; EQUIPMENT; MAGNETS; METALS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.