Published February 1983
| Version v1
Journal article
Effect of #betta#-radiation on aluminium-n-silicon interface properties
- 1. Kievskij Gosudarstvennyj Univ. (Ukrainian SSR)
Description
It is found that Al film in the Al-Si structure is rearranged and Si dissolved in Al segregates on the Al film surface in response to betatron #betta#-radiation. Moreover, amount of aluminium and carbon increases while that of fluorine decreases in the Si near-surface layer. The observed redistribution of Si, Al and impurities (C, F) in these structures is probably due to both the radiation defects which arise in the Al film and in Si and due to Si doping with 27Al nuclei resulted from photonuclear reactions
Additional details
Additional titles
- Original title (Russian)
- Действие #бетта#-излучения на свойства границы раздела алюминий-н-кремний
Publishing Information
- Journal Title
- Ukr. Fiz. Zh.
- Journal Volume
- 28
- Journal Issue
- 2
- Series
- Ukr. Fiz. Zh.
- Journal Page Range
- 259-263
- ISSN
- 0503-1265
INIS
- Country of Publication
- USSR
- Country of Input or Organization
- USSR
- INIS RN
- 14798868
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM; FILMS; GAMMA RADIATION; IMPURITIES; INCLUSIONS; INTERFACES; MEV RANGE 10-100; N-TYPE CONDUCTORS; PHYSICAL RADIATION EFFECTS; SEGREGATION; SILICON; SURFACE PROPERTIES
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; ELEMENTS; ENERGY RANGE; IONIZING RADIATIONS; MATERIALS; METALS; MEV RANGE; RADIATION EFFECTS; RADIATIONS; SEMICONDUCTOR MATERIALS; SEMIMETALS
Optional Information
- Notes
- For English translation see the journal Ukrainian Physics Journal (USA).