Published August 1988
| Version v1
Journal article
Temperature variation of the phonon frequencies in V3Si along the [110] direction by the X-ray inelastic scattering
- 1. AN Belorusskoj SSR, Minsk (Byelorussian SSR). Inst. Fiziki Tverdogo Tela i Poluprovodnikov
Description
The investigation of the intensity of X-ray diffuse scattering by the lattice vibrations along the second-order symmetry axis in V3Si single crystals is performed at different temperatures from 300 to 8 K and the phonon dispersion curves in this direction are determined. It is found that the phonon frequencies of all modes decrease with lowering temperature. (author)
Additional details
Publishing Information
- Journal Title
- Crystal Research and Technology
- Journal Volume
- 23
- Journal Issue
- 8
- Series
- Cryst. Res. Technol.
- Journal Page Range
- 1029-1034
- ISSN
- 0232-1300
- CODEN
- CRTED
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- German Democratic Republic
- INIS RN
- 20083559
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- INELASTIC SCATTERING; LATTICE VIBRATIONS; LOW TEMPERATURE; MEDIUM TEMPERATURE; MONOCRYSTALS; PHONONS; SOUND WAVES; TEMPERATURE DEPENDENCE; VANADIUM SILICIDES; VERY LOW TEMPERATURE; VISIBLE RADIATION; X RADIATION
- Descriptors DEC
- CRYSTALS; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; QUASI PARTICLES; RADIATIONS; SCATTERING; SILICIDES; SILICON COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; VANADIUM COMPOUNDS