Published March 2018
| Version v1
Journal article
Strength of nanoscale metallic multilayers
- 1. Department of Materials Science and Engineering, Carnegie Mellon University, 5000 Forbes Avenue, Pittsburgh, PA 15213 (United States)
- 2. Department of Mechanical Engineering and Materials, University of California at Santa Barbara, Santa Barbara, CA 93106 (United States)
- 3. Department of Materials Science and Engineering, Iowa State University, Ames, IA 50011 (United States)
Description
The relationship between microstructure, dislocation motion and mechanical response of metallic multilayered nanomaterials is investigated. Several competing theories for the dependence of hardness on layer thickness, namely Confined Layer Slip (CLS) and Hall-Petch (H-P) theories are discussed. Analysis of homophase and heterophase experimental data suggests that Hall-Petch with modified coefficients provides a good fit down to layer thicknesses of about 5 nm, below which experimental data starts to deviate. We suggest that at this layer thickness, dislocations accumulate in the interface, and assuming there is a constant dislocation density in each interface, the strength varies as h −1/2.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.scriptamat.2017.04.009Additional details
Identifiers
- DOI
- 10.1016/j.scriptamat.2017.04.009;
- PII
- S1359646217301859;
Publishing Information
- Journal Title
- Scripta Materialia
- Journal Volume
- 145
- Journal Page Range
- p. 132-136
- ISSN
- 1359-6462
- CODEN
- SCMAF7
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 50052929
- Subject category
- S36: MATERIALS SCIENCE; S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- DISLOCATIONS; EXPERIMENTAL DATA; HARDNESS; INTERFACES; LAYERS; MICROSTRUCTURE; NANOCOMPOSITES; NANOSTRUCTURES; THICKNESS
- Descriptors DEC
- CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DATA; DIMENSIONS; INFORMATION; LINE DEFECTS; MATERIALS; MECHANICAL PROPERTIES; NANOMATERIALS; NUMERICAL DATA
Optional Information
- Copyright
- Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.