Experience in application of X-ray fluorescence method to rock sample analysis

The applicability of X-ray fluorescence method (XFM) to rock sample analysis is considered. Described is the instrument complex for XFM including a special silica-lithium detector, a spectrometric unit and a multichannel pulse analyzer. Shown is the possibility of quantitative determination of rock components with the sensitivity not less than 10-3% and recurrence within the range of 1%. The results presented on XFM (sensitivity, information capabilities, rapidity, and radiation safety) testify to the prospects for its application as an analytical method of geology and geophysics