A study of conventional top spin valve structure through the built-up samples technique

'Built-up samples' (a batch of samples representing the different stages of deposition of a target structure) of the conventional top spin valve (SV) structure Si(1 0 0)/SiOx/Nb (5 nm)/Ni80Fe20 (4 nm)/Cu (3 nm)/Co (5 nm)/Fe50Mn50 (10 nm)/Nb (5 nm) were deposited by DC magnetron sputtering. Structural properties of the samples were probed by low angle X-ray reflectivity and high angle X-ray diffraction. Such strategy yielded more convincing results compared with the usual studies that examined the full SV structures alone. Magnetic and transport measurements were also performed on the samples. These measurements together yielded a complete picture on the evolution of properties in the SV structure, illustrating the ability of the 'built-up samples' strategy as an effective protocol for the investigation and optimization of various properties of SV