Published February 2, 2009 | Version v1
Journal article

The copper influence on the PL spectra of CdTe thin film as a component of the CdS/CdTe heterojunction

  • 1. Semiconductor Physics Lab, Faculty of Physics, Moldova State University, 60 A. Mateevici str., Chisinau, MD 2009 (Moldova, Republic of)
  • 2. Center for Clean Energy and Vehicles, Department of Electrical Engineering, University of South Florida, 4202 East Fowler Ave., Tampa, FL 33620 (United States)
  • 3. Engineering Department, University of Bacau, 157 Calea Marasesti, 600115 Bacau (Romania)

Description

The influence of annealing in the presence of CdCl2 and a thin copper layer deposited onto CdTe on the photoluminescence spectra of CdTe, as a component of CdS/CdTe heterojunction, has been studied for two excitation wavelengths: 0.337 μm and 0.6328 μm. The behavior of the PL was studied as a function of the measurement temperature and excitation intensity. At 0.6328 μm excitation, the interface PL consists of a known 1.43X band, and the chloride annealing enhances radiative transitions at 1.536 eV. The intensity of the 1.536 eV transitions increases when Cu is present. The PL of as-deposited CdTe films prepared in the presence of oxygen has the 1.45X band attenuated when excited with 0.337 μm excitation wavelength

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2008.10.087

Additional details

Identifiers

DOI
10.1016/j.tsf.2008.10.087;
PII
S0040-6090(08)01320-5;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
517
Journal Issue
7
Journal Page Range
p. 2195-2201
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
Symposium L: Thin film chalogenide photovoltaic materials
Acronym
EMRS 2008 spring meeting
Dates
26-30 May 2008
Place
Strasbourg (France)

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.