Reactor analysis of copper indium selenization
- 1. Delaware Univ., Newark, DE (USA). Inst. of Energy Conversion
Description
This paper presents a preliminary process analysis of selenization of copper/indium (Cu/In) bilayers in a flowing H2Se reactor. The analysis includes evaluations of heat treatments of Cu/In bilayers and the relationship between the composition and structure of the bilayer and the resultant CuInSe2 film, and investigation of selenization reaction kinetics including comparisons between the reaction of H2Se with bilayers and with single copper and indium layers. X-ray diffraction (XRD), energy dispersive spectroscopy (EDS), atomic absorption spectrophotometry (AA), as well as scanning electron (SEM) and optical microcopy have been used to study the selenization process. CuInSe2/(CdZn)S devices were also used to evaluate the quality of the CuInSe2 films. Devices with efficiencies greater than 10% have been fabricated
Additional details
Publishing Information
- Publisher
- IEEE Service Center.
- Imprint Place
- Piscataway, NJ (USA)
- Imprint Title
- Twenty first IEEE photovoltaic specialists conference 1990 (Conference Record)
- Imprint Pagination
- 1673 p.
- Journal Page Range
- p. 529-534.
Conference
- Title
- 21. Institute for Electrical and Electronics Engineers (IEEE) photovoltaic specialists conference.
- Dates
- 21-25 May 1990.
- Place
- Kissimmee, FL (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 22054845
- Subject category
- S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION SPECTRA; CHEMICAL COMPOSITION; CHEMICAL REACTION KINETICS; CHEMICAL REACTORS; COPPER SELENIDES; FABRICATION; HEAT TREATMENTS; INDIUM SELENIDES; OPTICAL MICROSCOPY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR DEVICES; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; COPPER COMPOUNDS; DIFFRACTION; ELECTRON MICROSCOPY; FILMS; INDIUM COMPOUNDS; KINETICS; MICROSCOPY; REACTION KINETICS; SCATTERING; SELENIDES; SELENIUM COMPOUNDS; SPECTRA; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Secondary number(s)
- CONF-900542--.