Photosensitization of nanocrystalline TiO2 film electrode with cadmium sulphoselenide
Creators
- 1. Hanyang University, Department of Chemistry, Sungdong-Ku, Haengdang-dong 17, Seoul 133791 (Korea, Republic of)
Description
Nanocrystalline titanium dioxide (TiO2) thin films composed of densely packed nanometer-sized grains have been successfully deposited onto an indium-doped-tin oxide (ITO) substrate. Then cadmium sulphoselenide (CdSSe) thin film was deposited onto pre-deposited TiO2 to form a TiO2/CdSSe film, at low temperature using a simple and inexpensive chemical method. The X-ray diffraction, selected area electron diffraction, scanning electron microscopy (SEM), energy dispersive X-ray analysis (EDX) and water contact angle techniques were used for film characterization. Purely rutile phase of TiO2 with super-hydrophilic and densely packed nanometer-sized spherical grains of approximate diameter 30-40 (±2) nm was observed. The increase in optical absorption was observed after CdSSe film deposition. Nest like surface morphology of CdSSe on TiO2 surface results in air trapping in the crevices which prevents water from adhering to the film with increase in water contact angle. Photosensitization of TiO2 with CdSSe was confirmed with light illumination intensity of 80 mW/cm2
Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2006.07.087;
- PII
- S0169-4332(06)01199-8;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 253
- Journal Issue
- 8
- Journal Page Range
- p. 3922-3926
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39003344
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION; CADMIUM; CADMIUM COMPOUNDS; CRYSTALS; DEPOSITION; DOPED MATERIALS; ELECTRODES; ELECTRON DIFFRACTION; INDIUM OXIDES; NANOSTRUCTURES; PHOTOSENSITIVITY; SCANNING ELECTRON MICROSCOPY; SELENIUM COMPOUNDS; SUBSTRATES; SULFUR COMPOUNDS; SURFACES; TEMPERATURE RANGE 0065-0273 K; THIN FILMS; TIN ADDITIONS; TITANIUM OXIDES; X-RAY DIFFRACTION
- Descriptors DEC
- ALLOYS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; FILMS; INDIUM COMPOUNDS; MATERIALS; METALS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; SCATTERING; SENSITIVITY; SORPTION; TEMPERATURE RANGE; TIN ALLOYS; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.