Published November 2024 | Version v1
Journal article

Light emission characteristics in nitride semiconductor nanowires fabricated by top-down method

  • 1. NTT Nanophotonics Center, NTT Corporation, Kanagawa, 243-0198 (Japan)
  • 2. NTT Basic Research Laboratories, NTT Corporation, Kanagawa, 243-0198 (Japan)

Description

Nanophotonic devices made from nitride semiconductors are promising for various applications, especially those utilizing ultraviolet-visible light with low-power consumption and high driving speed. Herein, nanowire structures are fabricated from a light-emitting diode epitaxial wafer and demonstrates the effectiveness of wet etching in top-down fabrication. Spontaneous emission from active layers and unanticipated lasing derived from a GaN layer in a single nanowire are observed by microphotoluminescence measurement. Lastly, the lasing mode through a 3D simulation of the eigenmodes in this nanowire structure is clarified. (© 2024 Wiley‐VCH GmbH)

Availability note (English)

Available from: http://dx.doi.org/10.1002/pssa.202400078

Additional details

Identifiers

Publishing Information

Journal Title
Physica Status Solidi. A, Applications and Materials Science (Online)
Journal Volume
221
Journal Issue
21
Journal Page Range
p. 1-6
ISSN
1862-6319
CODEN
PSSABA

Optional Information

Notes
AID: 2400078; Nitride semiconductors