Published November 27, 1990 | Version v1
Patent Metadata-only

Lens system for a photo ion spectrometer

Creators

Description

A lens system in a photo ion spectrometer for manipulating a primary ion beam and ionized atomic component is disclosed. The atomic components are removed from a sample by a primary ion beam using the lens system, and the ions are extracted for analysis. The lens system further includes ionization resistant coatings for protecting the lens system. 8 figs

Availability note (English)

Available from Patent and Trademark Office, Box 9, Washington, DC 20232 (United States).

Additional details

Publishing Information

Imprint Pagination
[10 p.].
IPC:
Int. Cl. H01J 49/44; H01J 49/06.
IPC
Int. Cl. H01J 49/44; H01J 49/06.
Patent number
US patent document 4,973,842/A/

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
25073762
Subject category
S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Non-conventional Literature
Descriptors DEI
DESIGN; ION BEAMS; LENSES; PROTECTIVE COATINGS; SPECTROMETERS
Descriptors DEC
BEAMS; COATINGS; MEASURING INSTRUMENTS

Optional Information

Secondary number(s)
US patent application 7-045,587.