Published January 1, 2005 | Version v1
Journal article

Impact on Diffraction Efficiency of Binary Optical Elements for Spot Exposure Superposing Ratio

  • 1. Institute of Ultra-Precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, Harbin 150001 (China)

Description

In fabrication of free form optical surfaces, spot exposure is a typical mode in laser photolithography. Proper selection of spot exposure superposing ratio is the key to optimize etching quality and writing speed. In this paper, a new composite diffractive grating structure is modeled for the influence on diffraction efficiency of binary optical elements caused by spot exposure superposing ratio. Composite grating can be transformed into one simple rectangular grating and two triangular gratings. Angular spectrum theory is used to describe the mathematical expression of the composite diffractive grating. Through simulation analysis, the relationships between diffraction efficiency and the other three items as grating depth, spot radius, and blaze wavelength, has been shown. Simulation results indicate that shape error caused by spot exposure ratio impact the diffraction efficiency greatly in deep etching, and the transmittance will reach maximal point approximately while spot exposure ratio is over 60%. This conclusion can be taken as the theoretical foundation for exposure frequency selection in laser photolithography figure generation

Availability note (English)

Available online at http://stacks.iop.org/1742-6596/13/418/jpconf5_13_096.pdf or at the Web site for the Journal of Physics. Conference Series (Online) (ISSN 1742-6596) http://www.iop.org/

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
13
Journal Issue
1
Journal Page Range
p. 418-421
ISSN
1742-6596

Conference

Title
7. international symposium on measurement technology and intelligent instruments
Dates
6-8 Sep 2005
Place
Huddersfield (United Kingdom)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
36111582
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
DIFFRACTION; EFFICIENCY; ERRORS; ETCHING; FABRICATION; FREQUENCY SELECTION; GRATINGS; LASERS; SIMULATION; SURFACES; WAVELENGTHS
Descriptors DEC
COHERENT SCATTERING; SCATTERING; SURFACE FINISHING; TUNING