Published 1985
| Version v1
Miscellaneous
Cement analysis by PIPS: comparison of the effect of different charged particle beams
Creators
- 1. Peninsula Technikon, Kasselsvlei (South Africa)
- 2. Council for Scientific and Industrial Research, Pretoria (South Africa). National Accelerator Centre
Description
The manufacture of cements involves the processing of geological materials from different sources, and the exact composition of the ores may have a profound effect on the performance of the final product. It is thus obvious that rapid analysis of raw materials and the products, is vital for process control. Since particle-induced prompt photon spectrometry (PIPPS) is a rapid, non-destructive and experimentally simple technique for multi-element analysis, the application of this technique was evaluated with standard cement, using 4.75 MeV protons, 2.0 MeV deuterons and 5.0 MeV alpha-particles
Additional details
Publishing Information
- Imprint Place
- Pretoria (South Africa)
- ISBN
- 0 7988 2371 2
- Imprint Title
- Second international symposium on analytical chemistry in the exploration, mining and processing of materials
- Imprint Pagination
- 348 p.
- Journal Page Range
- p. 189-190.
Conference
- Title
- 2. International symposium on analytical chemistry in the exploration, mining and processing of materials.
- Dates
- 15-19 Apr 1985.
- Place
- Pretoria (South Africa).
INIS
- Country of Publication
- South Africa
- Country of Input or Organization
- South Africa
- INIS RN
- 20001606
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- ALPHA BEAMS; ALPHA PARTICLES; CEMENTS; CHEMICAL ANALYSIS; COMPARATIVE EVALUATIONS; COULOMB EXCITATION; DEUTERON BEAMS; GAMMA RADIATION; IRRADIATION; MEV RANGE 01-10; NUCLEAR REACTIONS; PROTON BEAMS; SENSITIVITY; SPECTROSCOPY
- Descriptors DEC
- BEAMS; BUILDING MATERIALS; CHARGED PARTICLES; ELECTROMAGNETIC RADIATION; ENERGY RANGE; ENERGY-LEVEL TRANSITIONS; EVALUATION; EXCITATION; HELIUM IONS; HELIUM 4 BEAMS; ION BEAMS; IONIZING RADIATIONS; IONS; MATERIALS; MEV RANGE; NUCLEON BEAMS; PARTICLE BEAMS; RADIATIONS
Optional Information
- Notes
- An extended abstract.