Ion irradiation damage on tin side surface of float glass
Creators
- 1. Synchrotron Utilization Division, Centre for Advanced Technology, Indore 452 013 (India)
- 2. Laser Systems Engineering Division, Centre for Advanced Technology, Indore 452 013 (India)
- 3. Materials Science Division, Indira Gandhi Centre for Atomic Research, Kalpakkam 603 102 (India)
Description
Changes in the surface morphology and in-depth density variation in two surfaces of a float glass viz. the tin side and non-tin side surface, are investigated after 100 keV Ar ion irradiation. In the tin side surface, the irradiation caused a drastic change in density and surface roughness, whereas the other side (non-tin side surface) remained almost unaffected. Roughness of the tin side increases from 8 A to 41 A. Surface density also modified significantly with a redistribution of surface impurities. Monte Carlo simulations suggest that the displacement of tin and Fe impurities are responsible for the surface damage, which are experimentally examined by employing the total reflection X-ray fluorescence technique. Morphological and density changes are analyzed by grazing incidence X-ray reflectivity and atomic force microscopy techniques. Subsequent changes in surface morphology of float glass by ion irradiation are explained
Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2005.05.058;
- PII
- S0168-583X(05)00830-X;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 239
- Journal Issue
- 4
- Journal Page Range
- p. 383-390
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37025039
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ARGON IONS; ATOMIC FORCE MICROSCOPY; COMPUTERIZED SIMULATION; DAMAGE; DENSITY; FLUORESCENCE; GLASS; IMPURITIES; IRRADIATION; KEV RANGE 10-100; MONTE CARLO METHOD; MORPHOLOGY; REFLECTIVITY; ROUGHNESS; SURFACES; TIN; X RADIATION
- Descriptors DEC
- CALCULATION METHODS; CHARGED PARTICLES; ELECTROMAGNETIC RADIATION; ELEMENTS; EMISSION; ENERGY RANGE; IONIZING RADIATIONS; IONS; KEV RANGE; LUMINESCENCE; METALS; MICROSCOPY; OPTICAL PROPERTIES; PHOTON EMISSION; PHYSICAL PROPERTIES; RADIATIONS; SIMULATION; SURFACE PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.