Published May 17, 1996 | Version v1
Patent

Plant diagnosis device

Description

Standard data approximately defined are inputted as 1:1 functional data between at least two or more plant data and each of plant data are inputted. Diagnosis data corresponding to each of process data are formed based on the functional data. Limit value data to be a threshold value which determines whether the diagnosis data are in a predetermined state or not are formed. The diagnosis data and the limit value data are displayed in a recognizable state. If diagnosis data of a plurality of plants are displayed simultaneously, all of the plant data are substantially the same value with one standard datum if the plant is in a normal state. When abnormality should occur in the plant, the difference between the diagnosis data and the standard data is remarkable, and the difference between the diagnosis data of other normal plant data and the standard data are also made remarkably, accordingly, the display of a plurality of diagnosis data is scattered thereby capable of diagnosing the abnormality of the plant. (N.H.)

Availability note (English)

Available from JAPIO. Also available from EPO.

Additional details

Publishing Information

Imprint Pagination
9 p.
IPC:
Int. Cl. G05B23/02; G08B31/00; G21C17/00.
IPC
Int. Cl. G05B23/02; G08B31/00; G21C17/00.
Patent number
JP patent document 8-123539/A/

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
28001851
Subject category
S22: GENERAL STUDIES OF NUCLEAR REACTORS;
Resource subtype / Literary indicator
Non-conventional Literature
Descriptors DEI
ACCIDENTS; COMPARATIVE EVALUATIONS; DATA PROCESSING; DIAGNOSTIC TECHNIQUES; DISPLAY DEVICES; FUNCTIONAL MODELS; INDUSTRIAL PLANTS; NUCLEAR FACILITIES; SIMULATION; STANDARDS; THRESHOLD RIGIDITY
Descriptors DEC
COMPUTER OUTPUT DEVICES; COMPUTER-GRAPHICS DEVICES; EVALUATION

Optional Information

Secondary number(s)
JP patent application 6-264330.